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Accelerated life testing and reliability of high K multilayer ceramic capacitorsThe reliability of one lot of high K multilayer ceramic capacitors was evaluated using accelerated life testing. The degradation in insulation resistance was characterized as a function of voltage and temperature. The times to failure at a voltage-temperature stress conformed to a lognormal distribution with a standard deviation approximately 0.5.
Document ID
19810017849
Document Type
Conference Paper
Authors
Minford, W. J. (Bell Telephone Labs., Inc. Allentown, PA, United States)
Date Acquired
August 11, 2013
Publication Date
June 1, 1981
Publication Information
Publication: NASA. Marshall Space Flight Center Capacitor Technol., Appl. and Reliability
Subject Category
ELECTRONICS AND ELECTRICAL ENGINEERING
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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