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Record Details

Record 25 of 313
Microcrack closure in rocks under stress - Direct observation
Author and Affiliation:
Batzle, M. L.(Massachusetts Inst. of Tech., Cambridge, MA, United States)
Simmons, G.(Massachusetts Inst. of Tech., Cambridge, MA, United States)
Siegfried, R. W.(MIT, Cambridge, Mass., United States)
Abstract: Direct observations of the closure of microcracks in rocks under increasing stress are reported. Uniaxial stresses up to 300 bars were applied to untreated and previously heated samples of Westerly granite and Frederick diabase by a small hydraulic press which fit entirely within a scanning electron microscope. Crack closure characteristics are found to depend on crack orientation, with cracks perpendicular to the applied stress closing and those parallel tending to open, as well as crack aspect ratio, crack intersection properties, stress concentrations and surface roughness. Uniaxial and hydrostatic stress measurements are found to be strongly dependent on fracture content as observed by SEM, and the observed hysteresis in strain measurements in the first stress cycles is also related to microscopic processes
Publication Date: Dec 10, 1980
Document ID:
19810033737
(Acquired Nov 30, 1995)
Accession Number: 81A18141
Subject Category: GEOPHYSICS
Document Type: Journal Article
Publication Information: Journal of Geophysical Research; 85; Dec. 10
Publisher Information: United States
Contract/Grant/Task Num: ER-78-S-02-4972; NGR-22-009-540
Financial Sponsor: NASA; United States
Organization Source: Massachusetts Inst. of Tech.; Cambridge, MA, United States
Description: 19p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright
NASA Terms: AXIAL STRESS; CRACK CLOSURE; FRACTURE MECHANICS; MICROCRACKS; ROCKS; ELECTRON MICROSCOPY; GRANITE; HYDROSTATIC PRESSURE; STRESS CONCENTRATION; STRESS-STRAIN RELATIONSHIPS; SURFACE ROUGHNESS; THERMAL CYCLING TESTS
Imprint And Other Notes: Journal of Geophysical Research, vol. 85, Dec. 10, 1980, p. 7072-7090.
Miscellaneous Notes: 1980, p. 7072-7090
Availability Source: Other Sources
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