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Control of the Soft X-ray Polychromator on the Solar Maximum Mission SatelliteThe Soft X-ray Polychromator on the Solar Maximum Mission Satellite consists of two largely independent instruments: the Flat Crystal Spectrometer, a highly collimated scanning spectrometer mounted on a raster platform, and the Bent Crystal Spectrometer, a broadly collimated spectrometer providing high time-resolution (128 ms) spectra for the study of rapidly evolving phenomena. Each instrument is controlled by a microcomputer system built around an RCA 1802 microprocessor. This paper presents a discussion of the motivation for using a microprocessor in this application, and the design concepts that were implemented. The effectiveness of the approach as seen after several months of operation will also be discussed.
Document ID
19810036266
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Springer, L. A.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Levay, M.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Gilbreth, C. W.
(Lockheed Missiles and Space Co. Palo Alto, CA, United States)
Finch, M. L.
(Lockheed Research Laboratories Palo Alto, Calif., United States)
Bentley, R. D.
(London, University College, Dorking, Surrey, United Kingdom)
Firth, J. G.
(Science Research Council, Space and Astrophysics Div., Chilton Oxon, United Kingdom)
Date Acquired
August 11, 2013
Publication Date
January 1, 1981
Subject Category
Spacecraft Instrumentation
Report/Patent Number
AIAA PAPER 81-0203
Meeting Information
Meeting: Aerospace Sciences Meeting
Location: St. Louis, MO
Start Date: January 12, 1981
End Date: January 15, 1981
Sponsors: American Institute of Aeronautics and Astronautics
Accession Number
81A20670
Funding Number(s)
CONTRACT_GRANT: NAS5-23758
Distribution Limits
Public
Copyright
Other

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