Experimental image alignment systemA microcomputer-based instrument for image alignment with respect to a reference image is described which uses the DEFT sensor (Direct Electronic Fourier Transform) for image sensing and preprocessing. The instrument alignment algorithm which uses the two-dimensional Fourier transform as input is also described. It generates signals used to steer the stage carrying the test image into the correct orientation. This algorithm has computational advantages over algorithms which use image intensity data as input and is suitable for a microcomputer-based instrument since the two-dimensional Fourier transform is provided by the DEFT sensor.
Document ID
19810053344
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Moyer, A. L. (Deft Laboratories, Inc. East Syracuse, NY, United States)
Kowel, S. T. (Syracuse Univ. NY, United States)
Kornreich, P. G. (Syracuse University Syracuse, NY, United States)
Date Acquired
August 11, 2013
Publication Date
January 1, 1980
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: Seminar on Minicomputers and microprocessors in optical systems