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Parallelism maps for optically contacted etalonsA measurement technique is described that is capable of producing accurate numerical maps of the parallelism defect of optically contacted Fabry-Perot etalons. A photoelectric raster scan of the etalon transmission intensity distribution is performed at each of three closely spaced etalon tunings, one at maximum on-axis and two at the half-maxima on-axis positions. Simple data manipulation gives numerical or contour maps of the parallelism defect. Results demonstrating the effect of mechanical constraints on etalon parallelism are presented
Document ID
19810059406
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Killeen, T. L.
(Michigan Univ. Ann Arbor, MI, United States)
Hays, P. B.
(Michigan Univ. Ann Arbor, MI, United States)
Devos, J.
(Michigan, University Ann Arbor, MI, United States)
Date Acquired
August 11, 2013
Publication Date
August 1, 1981
Publication Information
Publication: Applied Optics
Volume: 20
Subject Category
Optics
Accession Number
81A43810
Funding Number(s)
CONTRACT_GRANT: NAS5-24296
Distribution Limits
Public
Copyright
Other

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