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Forming electrical interconnections through semiconductor wafersAn information processing system based on CMOS/SOS technology is being developed by NASA to process digital image data collected by satellites. An array of holes is laser drilled in a semiconductor wafer, and a conductor is formed in the holes to fabricate electrical interconnections through the wafers. Six techniques are used to form conductors in the silicon-on-sapphire (SOS) wafers, including capillary wetting, wedge extrusion, wire intersection, electroless plating, electroforming, double-sided sputtering and through-hole electroplating. The respective strengths and weaknesses of these techniques are discussed and compared, with double-sided sputtering and the through-hole plating method achieving best results. In addition, hollow conductors provided by the technique are available for solder refill, providing a natural way of forming an electrically connected stack of SOS wafers.
Document ID
19810061985
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Anthony, T. R.
(GE Research and Development Center Schenectady, NY, United States)
Date Acquired
August 11, 2013
Publication Date
August 1, 1981
Publication Information
Publication: Journal of Applied Physics
Volume: 52
Subject Category
Electronics And Electrical Engineering
Accession Number
81A46389
Funding Number(s)
CONTRACT_GRANT: NAS5-25654
Distribution Limits
Public
Copyright
Other

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