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Investigating reliability attributes of silicon photovoltaic cells - An overviewReliability attributes are being developed on a wide variety of advanced single-crystal silicon solar cells. Two separate investigations: cell-contact integrity (metal-to-silicon adherence), and cracked cells identified with fracture-strength-reducing flaws are discussed. In the cell-contact-integrity investigation, analysis of contact pull-strength data shows that cell types made with different metallization technologies, i.e., vacuum, plated, screen-printed and soldered, have appreciably different reliability attributes. In the second investigation, fracture strength was measured using Czochralski wafers and cells taken at various stages of processing and differences were noted. Fracture strength, which is believed to be governed by flaws introduced during wafer sawing, was observed to improve (increase) after chemical polishing and other process steps that tend to remove surface and edge flaws.
Document ID
19820061257
Document Type
Reprint (Version printed in journal)
Authors
Royal, E. L. (California Institute of Technology, Jet Propulsion Laboratory, Energy Technology Engineering Section, Pasadena CA, United States)
Date Acquired
August 10, 2013
Publication Date
August 1, 1982
Publication Information
Publication: IEEE Transactions on Reliability
Volume: R-31
Subject Category
ENERGY PRODUCTION AND CONVERSION
Distribution Limits
Public
Copyright
Other