Electron microprobe analysis of trace elements in minerals at 10 PPM concentrations

An improved technique is developed for measuring backgrounds during trace element analysis of crystals and glass using electron microprobes. This technique overcomes major difficulties encountered with conventional techniques, such as the problem of obtaining the net X-ray intensity of the characteristic emission line of interest with sufficient precision and accuracy, as well as the error due to the inability to directly measure the intensity at the wavelength of the characteristic line on the sample being analyzed. It is shown that this technique can yield reproducible results to within 4 ppm in olivine, and has a minimum uncertainty and detection limit of 10 ppm Nd in olivine.