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Computation of Bragg Reflection for Layered MicrostructuresBragg diffractors analyzed for use in X-ray mirrors and other applications. SLM tailored to specific applications by varying layer thicknesses and number of layers to control reflectivity diffraction width, and wavelength resolution. Applications as glancing incidence mirrors or filters for wavelengths of few to few hundred angstroms.
Document ID
19830000300
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Underwood, J. W. (CALTECH)
Barbee, T. W. (CALTECH)
Date Acquired
August 11, 2013
Publication Date
April 1, 1984
Publication Information
Publication: NASA Tech Briefs
Volume: 8
Issue: 1
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-15880
Accession Number
83B10300
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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