NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Radiation-Hardness Data For Semiconductor DevicesDocument presents data on and analysis of radiation hardness of various semiconductor devices. Data specifies total-dose radiation tolerance of devices. Volume 1 of report covers diodes, bipolar transistors, field effect transistors, silicon controlled rectifiers and optical devices. Volume 2 covers integrated circuits. Volume 3 provides detailed analysis of data in volumes 1 and 2.
Document ID
19830000507
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Price, W. E.
(CALTECH)
Nichols, D. K.
(CALTECH)
Brown, S. F.
(CALTECH)
Gauthier, M. K.
(CALTECH)
Martin, K. E.
(CALTECH)
Date Acquired
August 11, 2013
Publication Date
November 1, 1984
Publication Information
Publication: NASA Tech Briefs
Volume: 8
Issue: 2
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-15787
Accession Number
83B10507
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.
No Preview Available