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Record Details

Record 54 of 20237
On the cause of the flat-spot phenomenon observed in silicon solar cells at low temperatures and low intensities
Availability: Go to Request Form
Author and Affiliation:
Weizer, V. G.(NASA Lewis Research Center, Cleveland, OH, United States)
Broder, J. D.(NASA Lewis Research Center, Cleveland, OH, United States)
Brandhorst, H. W., Jr.(NASA Lewis Research Center, Cleveland, OH, United States)
Forestieri, A. F.(NASA Lewis Research Center, Cleveland, OH, United States)
Abstract: A model that explains the flat-spot power loss phenomenon is presented. Evidence suggests that the effect is due to localized metallurgical interactions between the silicon substrate and the contact metallization. These reactions are shown to result in localized regions in which the P-N junction is destroyed and replaced with a metal semiconductor-like interface. The effects of thermal treatment, crystallographic orientation, junction depth, and metallization are shown along with a method of preventing the effect through the suppression of vacancy formation at the free surface of the contact metallization. Data indicating the effectiveness of a TiN diffusion barrier in preventing the effect are also given.
Publication Date: Jun 01, 1982
Document ID:
19830006434
(Acquired Nov 13, 1995)
Accession Number: 83N14705
Subject Category: ENERGY PRODUCTION AND CONVERSION
Document Type: Conference Paper
Publication Information: ESA Photovoltaic Generators in Space; p. p 65-70
Publisher Information: International Organization
Financial Sponsor: NASA; International Organization
Organization Source: NASA Lewis Research Center; Cleveland, OH, United States
Description: 6p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: No Copyright
NASA Terms: AEROSPACE ENVIRONMENTS; POWER EFFICIENCY; SOLAR CELLS; CRYSTALLOGRAPHY; METALLIZING; MOLECULAR INTERACTIONS; P-N JUNCTIONS; SPACE ENVIRONMENT SIMULATION; SUBSTRATES
Imprint And Other Notes: In ESA Photovoltaic Generators in Space p 65-70 (SEE N83-14694 05-44)
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