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High resolution X-ray scattering measurementsThe results of high angular resolution grazing incidence scattering measurements of highly polished, coated optical flats in the X-ray spectral range of 1.5 to 6.4 keV are reported. The interpretation of these results in terms of surface microtopography is presented and the implications for grazing incidence X-ray imaging are discussed.
Document ID
19830031511
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Zombeck, M. V. (Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Braeuninger, H. (Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Ondrusch, A. (Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Predehl, P. (Max-Planck-Institut fuer Physik und Astrophysik Garching, Germany)
Date Acquired
August 11, 2013
Publication Date
January 1, 1982
Subject Category
Optics
Meeting Information
Meeting: High resolution soft X-ray optics
Location: Brookhaven, NY
Start Date: November 18, 1981
End Date: November 20, 1981
Accession Number
83A12729
Funding Number(s)
CONTRACT_GRANT: NAS8-32667
Distribution Limits
Public
Copyright
Other

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