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Comparison of NDE techniques for sintered-SiC componentsHigh frequency, bulk-wave ultrasonics detected defects in manufactured SiC components. In addition, gas-turbine blades and vanes were examined by scanning laser acoustic microscopy (SLAM). Comparative results obtained on simple shapes such as disks and bars by microfocus X-ray radiography, ultrasonics, scanning photoacoustic spectroscopy, and SLAM are discussed.
Document ID
19830041047
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Srinivasan, M. (Carborundum Co. Niagara Falls, NY, United States)
Lawler, D. (Carborundum Co. Niagara Falls, NY, United States)
Inglehart, L. J. (Carborundum Co. Niagara Falls, NY, United States)
Thomas, R. L. (Wayne State University Detroit, MI, United States)
Yuhas, D. (Sonoscan, Inc. Bensenville, IL, United States)
Date Acquired
August 11, 2013
Publication Date
October 1, 1982
Subject Category
Quality Assurance And Reliability
Accession Number
83A22265
Funding Number(s)
CONTRACT_GRANT: DEN3-167
CONTRACT_GRANT: DEN3-168
Distribution Limits
Public
Copyright
Other

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