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Mudrocks examined by backscattered electron microscopyA method of studying mudrocks is developed using backscattered electrons (BSE) in scanning electron microscopy. Commercially available detectors are utilized to mix the BSE and secondary electron signals in order to obtain the optimum image for a particular material. Thin sections or polished rock chip surfaces are examined with BSE which provides both the atomic number contrast and topographic contrast. This technique provides very detailed information about the form and composition of individual grains in the mudrock thin sections and can be used in studies of the source, mode of deposition, diagenesis, and tectonic deformational history of mudrocks.
Document ID
19830042060
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Pye, K.
(Cambridge University Cambridge, United Kingdom)
Krinsley, D.
(Arizona State University Tempe, AZ, United States)
Date Acquired
August 11, 2013
Publication Date
February 3, 1983
Publication Information
Publication: Nature
Volume: 301
Subject Category
Earth Resources And Remote Sensing
Accession Number
83A23278
Funding Number(s)
CONTRACT_GRANT: NAG2-174
CONTRACT_GRANT: NAGW-24
Distribution Limits
Public
Copyright
Other

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