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An alpha particle instrument with alpha, proton, and X-ray modes for planetary chemical analysesThe interaction of alpha particles with matter is employed in a compact instrument that could provide rather complete in-situ chemical analyses of surfaces and thin atmospheres of extraterrestrial bodies. The instrument is a miniaturized and improved version of the Surveyor lunar instrument. The backscattering of alpha particles and (alpha, p) reactions provide analytical data on the light elements (carbon-iron). An X-ray mode that detects the photons produced by the alpha sources provides sensitivity and resolution for the chemical elements heavier than about silicon. The X-rays are detected by semiconductor detectors having a resolution between 150 and 250 eV at 5.9 keV. Such an instrument can identify and determine with good accuracy 99 percent of the atoms (except hydrogen) in rocks. For many trace elements, the detecting sensitivity is a few ppm. Auxiliary sources could be used to enhance the sensitivities for elements of special interest. The instrument could probably withstand the acceleration involved in semi-hard landings.
Document ID
19830055500
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Economou, T. E.
(Chicago Univ. Chicago, IL, United States)
Turkevich, A. L.
(Chicago, University Chicago, IL, United States)
Date Acquired
August 11, 2013
Publication Date
January 1, 1976
Publication Information
Publication: Nuclear Instruments and Methods
Volume: 134
ISSN: 0167-5087
Subject Category
Instrumentation And Photography
Accession Number
83A36718
Funding Number(s)
CONTRACT_GRANT: NGR-14-001-135
Distribution Limits
Public
Copyright
Other

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