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Specimen Holder for Analytical Electron MicroscopesReduces spectral contamination by spurious X-ray. Specimen holder made of compressed carbon, securely retains standard electron microscope grid (disk) 3 mm in diameter and absorbs backscattered electrons that otherwise generate spurious X-rays. Since holder inexpensive, dedicated to single specimen when numerous samples examined.
Document ID
19840000331
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Clanton, U. S. (Lockheed)
Isaacs, A. M. (Microbeam)
Mackinnon, I.
Date Acquired
August 12, 2013
Publication Date
April 1, 1985
Publication Information
Publication: NASA Tech Briefs
Volume: 8
Issue: 4
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MSC-20398
Accession Number
84B10331
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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