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Electron-beam induced current characterization of back-surface field solar cells using a chopped scanning electron microscope beamA chopped electron beam induced current (EBIC) technique for the chacterization of back-surface field (BSF) solar cells is presented. It is shown that the effective recombination velocity of the low-high junction forming the back-surface field of BSF cells, in addition to the diffusion length and the surface recombination velocity of the surface perpendicular to both the p-n and low-high junctions, can be determined from the data provided by a single EBIC scan. The method for doing so is described and illustrated. Certain experimental considerations taken to enhance the quality of the EBIC data are also discussed.
Document ID
19840038079
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Luke, K. L. (California State University Long Beach, CA, United States)
Cheng, L.-J. (California Institute of Technology, Jet Propulsion Laboratory, Pasadena CA, United States)
Date Acquired
August 12, 2013
Publication Date
January 15, 1984
Publication Information
Publication: Journal of Applied Physics
Volume: 55
ISSN: 0021-8979
Subject Category
ENERGY PRODUCTION AND CONVERSION
Distribution Limits
Public
Copyright
Other