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Generation-recombination noise in extrinsic photoconductive detectorsA theory of generation-recombination noise is presented and applied to the analysis of the performance limitations of extrinsic photoconductive detectors. The theory takes account both of the photoinduced generation of carriers and of thermal generation that is due to the finite temperature of the detector. Explicit formulas are derived that relate the detector response time, responsivity, and noise equivalent power to the material properties of the photoconductor (such as the presence of compensating impurities) and to the detector's operating conditions, such as its temperature and the presence of background radiation. The detector's performance is shown to degrade at high background levels because of saturation effects.
Document ID
19840055589
Document Type
Reprint (Version printed in journal)
Authors
Brukilacchio, T. J.
(Rochester Univ. NY, United States)
Skeldon, M. D.
(Rochester, University Rochester, NY, United States)
Boyd, R. W.
(Rochester, University; C. E. Kenneth Mees Observatory, Rochester, NY, United States)
Date Acquired
August 12, 2013
Publication Date
June 1, 1984
Publication Information
Publication: Optical Society of America, Journal, B: Optical Physics
Volume: 1
ISSN: 0740-3224
Subject Category
Instrumentation And Photography
Accession Number
84A38376
Funding Number(s)
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Other

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