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Surface diagnosis of large reflector antennas using microwave holographic metrology - An iterative approachThe radiation pattern of an antenna can be significantly affected by reflector surface errors. A minimization of losses due to surface inaccuracies is, therefore, required. A suitable procedure for the determination of the deviations of the surface from its ideal geometry is based on the microwave holographic technique. In this procedure, the complex pattern of the antenna is measured, and the Fourier transform relationship, existing between the radiation pattern and the function related to the current distribution on the reflector surface, is applied. It is naturally desirable to limit the amount of measured data. The present investigation is concerned with the concept of the Fourier transform relationship between the induced current and the far field. It is demonstrated that the relationship, in general, can be interpreted as a summation of many Fourier transforms. An iterative scheme is employed to continue the far-field pattern outside the measurement window.
Document ID
19840065870
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Rahmat-Samii, Y.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena CA, United States)
Date Acquired
August 12, 2013
Publication Date
October 1, 1984
Publication Information
Publication: Radio Science
Volume: 19
ISSN: 0048-6604
Subject Category
Communications And Radar
Accession Number
84A48657
Distribution Limits
Public
Copyright
Other

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