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High-Temperature Hall-Effect ApparatusCompact furnace minimizes thermal gradients and electrical noise. Semiautomatic Hall-effect apparatus takes measurements on refractory semiconductors at temperatures as high as 1,100 degrees C. Intended especially for use with samples of high conductivity and low chargecarrier mobility that exhibit low signal-to-noise ratios, apparatus carefully constructed to avoid spurious electromagnetic and thermoelectric effects that further degrade measurements.
Document ID
19850000038
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Wood, C.
(CALTECH)
Lockwood, R. A.
(CALTECH)
Chemielewski, A. B.
(CALTECH)
Parker, J. B.
(CALTECH)
Zoltan, A.
(CALTECH)
Date Acquired
August 12, 2013
Publication Date
June 1, 1985
Publication Information
Publication: NASA Tech Briefs
Volume: 9
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
NPO-16279
Accession Number
85B10038
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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