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Analyzing Microchips With Dark-Field Negative PhotomicrographyInverse development process yields fine details. Photomicrographic technique produces images of integrated-circuit chips. Technique based on dark-field illumination: (chip lit with bright central spot of light and photographed by light scattered or diffracted from spot. Reveals more about microstructure patterns related to photoresist masking than more conventional bright-field method.
Document ID
19850000179
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Suszko, S. F.
(Caltech)
Date Acquired
August 12, 2013
Publication Date
October 1, 1985
Publication Information
Publication: NASA Tech Briefs
Volume: 9
Issue: 2
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-16299
Accession Number
85B10179
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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