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Studying Crystal Growth With the Peltier EffectPeltier interface demarcation (PID) shown useful as aid in studying heat and mass transfer during growth of crystals from molten material. In PID, two dissimilar "metals" solid and liquid phases of same material. Current pulse passed through unidirectionally solidifying sample to create rapid Peltier thermal disturbance at liquid/solid interface. Disturbance, measured by thermocouple stationed along path of solidification at or near interface, provides information about position and shape of interface.
Document ID
19850000346
Document Type
Other - NASA Tech Brief
Authors
Larsen, David J., Jr. (Grumman Aerospace Corp.)
Dressler, B. (Grumman Aerospace Corp.)
Silberstein, R. P. (Grumman Aerospace Corp.)
Poit, W. J. (Grumman Aerospace Corp.)
Date Acquired
August 12, 2013
Publication Date
January 1, 1986
Publication Information
Publication: NASA Tech Briefs
Volume: 9
Issue: 3
ISSN: 0145-319X
Subject Category
MATERIALS
Report/Patent Number
MFS-28041
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.