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Analysis of subpixel registrationThe area of subpixel accuracy in image registration and edge detection was studied. Two main directions of research were pursued, edge detection and matching based on the digital geometry of edges, and random field models for probablistic analysis of registration error. In the edge detection approach, error bounds and error probabilities were computed using theoretical models. Algorithms were developed and tests on simulated imagery. The methods appear promising for high accuracy edge position estimation and registration, though further refinement of the procedures is required. Using random field models, a statistical measure of the quality of the cross correlation peak as an estimate of the offset between a sensed and a reference image was developed. Simulations were performed to determine the validity of this estimte with real imagery and to study the results of interpolating digital correlation functions to estimate the translation offset to subpixel accuracy.
Document ID
19850007958
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Berenstein, C. A.
(Maryland Univ. College Park, MD, United States)
Kanal, L. N.
(Maryland Univ. College Park, MD, United States)
Lavine, D.
(Maryland Univ. College Park, MD, United States)
Olson, E. C.
(Maryland Univ. College Park, MD, United States)
Slud, E.
(Maryland Univ. College Park, MD, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1984
Publication Information
Publication: Texas A and M Univ. Proc. of the 2nd Ann. Symp. on Math. Pattern Recognition and Image Analysis Program
Subject Category
Numerical Analysis
Accession Number
85N16267
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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