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Upset susceptibility study employing circuit analysis and digital simulationAn approach to predict the susceptibility of digital systems to signal disturbances is described. Electrical disturbances on a digital system's input and output lines can be induced by activities and conditions including static electricity, lightning discharge, electromagnetic interference (EMI), and electromagnetic pulsation (EMP). The electrical signal disturbances employed for the susceptibility study were limited to nondestructive levels, i.e., the system does not sustain partial or total physical damage and reset and/or reload brings the system to an operational status. The front-end transition from the electrical disturbances to the equivalent digital signals was accomplished by computer-aided circuit analysis. The super-sceptre (system for circuit evaluation of transient radiation effects) programs was used. Gate models were developed according to manufacturers' performance specifications and parameters resulting from construction processes characteristic of the technology. Digital simulation at the gate and functional level was employed to determine the impact of the abnormal signals on system performance and to study the propagation characteristics of these signals through the system architecture. Example results are included for an Intel 8080 processor configuration.
Document ID
19850008035
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Carreno, V. A.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 12, 2013
Publication Date
December 1, 1984
Publication Information
Publication: Intern. Aerospace and Ground Conf. on Lightning and Static Elec.
Subject Category
Communications And Radar
Accession Number
85N16344
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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