Microwave Surface Resistivity of Several Materials at Ambient Temperature

Microwave surface resistivity of a number of metal and other sample materials was measured at X-band, approximately 8400 MHz. The method of measurement uses a TE sub 011 mode circular waveguide cavity resonator wherein the sample is used as one end of the cavity. This method has been used previously in JPL work with good results. Microwave reflection loss and noise arising from the dissipative loss are given, for materials having negligible transmission leakage.