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Characterization of material surfaces exposed to atomic oxygen on space shuttle missionsMaterial samples prepared for exposure to ambient atomic oxygen encountered during space shuttle flights in low Earth orbit were characterized by the experimental techniques of ELLIPSOMETRY, ESCA, PIXE, and RBS. The first group of samples, which were exposed during the STS-8 mission, exhibited some very interesting results. The second group of samples, which are to be exposed during the upcoming STS-17 mission, have been especially prepared to yield quantitative information on the optical changes, oxygen solution, and surface layer formation on metal films of silver, gold, nickel, chromium, aluminum, platinum, and palladium evaporated onto optically polished silicon wafers.
Document ID
19850013910
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Fromhold, A. T.
(Auburn Univ. AL, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1985
Publication Information
Publication: Alabama Univ. Res. Rept.: 1984 NASA/ASEE Summer Faculty Fellowship Program (NASA-CR
Subject Category
Inorganic And Physical Chemistry
Accession Number
85N22220
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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