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s-wave threshold in electron attachment - Results in 2-C4F6 and CFCl3 at ultra-low electron energiesElectron attachment lineshapes and cross sections are reported for the processes 2-C4F6(-)/2-C4F6 and Cl(-)/CFCl3 at electron energies of 0-120 and 0-140 meV, and at resolutions of 6 and 7 meV (FWHM), respectively. As in previous measurements in CCl4 and SF6, the results show resolution-limited narrow structure in the cross section at electron energies below 15 meV. This structure arises from the divergence of the s-wave cross section in the limit of zero electron energy. Comparisons are given with swarm-measured results, and with collisional ionization (high-Rydberg attachment) data in this energy range.
Document ID
19850036220
Document Type
Reprint (Version printed in journal)
Authors
Chutjian, A. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Alajajian, S. H. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ajello, J. M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Orient, O. J. (California Institute of Technology, Jet Propulsion Laboratory, Pasadena CA, United States)
Date Acquired
August 12, 2013
Publication Date
November 14, 1984
Publication Information
Publication: Journal of Physics B - Atomic and Molecular Physics
Volume: 17
ISSN: 0022-3700
Subject Category
ATOMIC AND MOLECULAR PHYSICS
Distribution Limits
Public
Copyright
Other