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The Single Event Upset (SEU) response to 590 MeV protonsThe presence of high-energy protons in cosmic rays, solar flares, and trapped radiation belts around Jupiter poses a threat to the Galileo project. Results of a test of 10 device types (including 1K RAM, 4-bit microP sequencer, 4-bit slice, 9-bit data register, 4-bit shift register, octal flip-flop, and 4-bit counter) exposed to 590 MeV protons at the Swiss Institute of Nuclear Research are presented to clarify the picture of SEU response to the high-energy proton environment of Jupiter. It is concluded that the data obtained should remove the concern that nuclear reaction products generated by protons external to the device can cause significant alteration in the device SEU response. The data also show only modest increases in SEU cross section as proton energies are increased up to the upper limits of energy for both the terrestrial and Jovian trapped proton belts.
Document ID
19850036453
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Nichols, D. K.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Price, W. E.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Smith, L. S.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Soli, G. A.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena CA, United States)
Date Acquired
August 12, 2013
Publication Date
December 1, 1984
Publication Information
Publication: IEEE Transactions on Nuclear Science
Volume: NS-31
ISSN: 0018-9499
Subject Category
Nuclear And High-Energy Physics
Accession Number
85A18604
Distribution Limits
Public
Copyright
Other

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