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Ratioed scatter diagrams - An erotetic method for phase identification on complex surfaces using scanning Auger microscopyBy ratioing multiple Auger intensities and plotting a two-dimensional occupational scatter diagram while digitally scanning across an area, the number and elemental association of surface phases can be determined. This can prove a useful tool in scanning Auger microscopic analysis of complex materials. The technique is illustrated by results from an anomalous region on the reaction zone of a SiC/Ti-6Al-4V metal matrix composite material. The anomalous region is shown to be a single phase associated with sulphur and phosphorus impurities. Imaging of a selected phase from the ratioed scatter diagram is possible and may be a useful technique for presenting multiple scanning Auger images.
Document ID
19850037042
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Browning, R.
(NASA Ames Research Center; Stanford Joint Institute for Surface and Microstructure Research Moffett Field, CA, United States)
Date Acquired
August 12, 2013
Publication Date
December 1, 1984
Publication Information
Publication: Journal of Vacuum Science and Technology A
Volume: 2
ISSN: 0734-2101
Subject Category
Inorganic And Physical Chemistry
Accession Number
85A19193
Funding Number(s)
CONTRACT_GRANT: NCC2-230
Distribution Limits
Public
Copyright
Other

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