A low noise infrared spot scanner for testing detector arraysA low noise spot scanner has been built for use in testing the performance of infrared detector arrays for NASA's IR detector technology development program and the University of California's MICRO program. The scanner provides a convenient low noise detector test environment and a wide range of test conditions including versatile temperature control of the detector, ambient background, and blackbody source temperature and control of spot size, color, and brightness.
Document ID
19850043235
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Puetter, R. C. (California Univ. La Jolla, CA, United States)
Brissenden, P. (California Univ. La Jolla, CA, United States)
Casler, J. (California Univ. La Jolla, CA, United States)
Hier, R. G. (California Univ. La Jolla, CA, United States)
Jones, B. (California, University La Jolla, CA, United States)