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A low noise infrared spot scanner for testing detector arraysA low noise spot scanner has been built for use in testing the performance of infrared detector arrays for NASA's IR detector technology development program and the University of California's MICRO program. The scanner provides a convenient low noise detector test environment and a wide range of test conditions including versatile temperature control of the detector, ambient background, and blackbody source temperature and control of spot size, color, and brightness.
Document ID
19850043235
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Puetter, R. C.
(California Univ. La Jolla, CA, United States)
Brissenden, P.
(California Univ. La Jolla, CA, United States)
Casler, J.
(California Univ. La Jolla, CA, United States)
Hier, R. G.
(California Univ. La Jolla, CA, United States)
Jones, B.
(California, University La Jolla, CA, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1984
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: Instrumentation in astronomy V
Location: London
Start Date: September 7, 1983
End Date: September 9, 1983
Sponsors: SPIE and ISOE
Accession Number
85A25386
Funding Number(s)
CONTRACT_GRANT: NASW-3702
Distribution Limits
Public
Copyright
Other

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