Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Chin, R. T. (Wisconsin Univ. Madison, WI, United States) Yeh, C.-L. (Wisconsin, University Madison, United States) Olson, W. S. (Eastman Kodak Research Laboratories Rochester, NY, United States) Date Acquired
August 12, 2013
Publication Date
July 1, 1985
Publication Information
Publication: IEEE Transactions on Pattern Analysis and Machine Intelligence
Volume: PAMI-7
ISSN: 0162-8828
Subject Category
Instrumentation And Photography Accession Number
85A41089
Distribution Limits
Public