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Computing in the presence of soft bit errorsIt is shown that single-event-upsets (SEUs) due to cosmic rays are a significant source of single bit error in spacecraft computers. The physical mechanism of SEU, electron hole generation by means of Linear Energy Transfer (LET), it discussed with reference made to the results of a study of the environmental effects on computer systems of the Galileo spacecraft. Techniques for making software more tolerant of cosmic ray effects are considered, including: reducing the number of registers used by the software; continuity testing of variables; redundant execution of major procedures for error detection; and encoding state variables to detect single-bit changes. Attention is also given to design modifications which may reduce the cosmic ray exposure of on-board hardware. These modifications include: shielding components operating in LEO; removing low-power Schottky parts; and the use of CMOS diodes. The SEU parameters of different electronic components are listed in a table.
Document ID
19850065607
Document Type
Conference Paper
Authors
Rasmussen, R. D. (California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1984
Subject Category
SPACECRAFT INSTRUMENTATION
Meeting Information
1984 American Control Conference(San Diego, CA)
Distribution Limits
Public
Copyright
Other