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Inverse methods in rough-surface scatteringFor the case of unknown surfaces, which can only be studied by means of remote sensors, roughness scale relative to incident wavelength can be determined through the examination of angular scattering characteristics in both vertically and horizontally polarized states. Generally, an angular backscattering curve without polarization dependence indicates scattering by roughness scales that are larger than the incident wavelength. Over angular regions where both vertical and horizontal returns are well separated, the scattering must be dominated by roughness scales that are small by comparison with wavelength.
Document ID
19850066820
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Fung, A. K.
(University of Kansas Center for Research Inc., Lawrence, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1985
Subject Category
Physics (General)
Meeting Information
Meeting: Inverse methods in electromagnetic imaging
Location: Bad Windsheim
Start Date: September 18, 1983
End Date: September 24, 1983
Sponsors: NATO, DFVLR, U. S. Army, Siemens A. G., and Univ. of Illinois
Accession Number
85A48971
Funding Number(s)
CONTRACT_GRANT: NAG5-268
CONTRACT_GRANT: DAAG29-80-K-0018
Distribution Limits
Public
Copyright
Other

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