NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Submicron Silicon MOSFETProcess for making metal-oxide/semiconductor field-effect transistors (MOSFET's) results in gate-channel lengths of only few hundred angstroms about 100 times as small as state-of-the-art devices. Gates must be shortened to develop faster MOSFET's; proposed fabrication process used to study effects of size reduction in MOS devices and eventually to build practical threedimensional structures.
Document ID
19860000004
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Daud, T.
(Caltech)
Date Acquired
August 12, 2013
Publication Date
July 1, 1986
Publication Information
Publication: NASA Tech Briefs
Volume: 10
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-16601
Accession Number
86B10004
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.
No Preview Available