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Stress Measurement by Geometrical OpticsFast, simple technique measures stresses in thin films. Sample disk bowed by stress into approximately spherical shape. Reflected image of disk magnified by amount related to curvature and, therefore, stress. Method requires sample substrate, such as cheap microscope cover slide, two mirrors, laser light beam, and screen.
Document ID
19860000166
Document Type
Other - NASA Tech Brief
Authors
Robinson, R. S. (Colorado State University)
Rossnagel, S. M. (Colorado State University)
Date Acquired
August 12, 2013
Publication Date
June 1, 1986
Publication Information
Publication: NASA Tech Briefs
Volume: 10
Issue: 2
ISSN: 0145-319X
Subject Category
MECHANICS
Report/Patent Number
LEW-14169
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.