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Mephisto: Interfacial Destabilization in Metal AlloysThe destabilizing mechanisms at a solidification interface were studied to obtain information on the kinetics and morphologies in the transient and steady state, and to separate the influences of liquid phase instabilities from interfacial instabilities. A differential seebeck voltage measurements technique was developed to provide a continuous record of the solid-liquid interface temperature as the solidification rate is varied to determine the kinetic coefficients. Signal processing and noise suppression techniques allow nonovolt precision which corresponds to mK accuracy for the interfacial temperature.
Document ID
19860000612
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Favier, J. J.
(Commissariat a l'Energie Atomique Grenoble, France)
Malmejac, Y.
(Commissariat a l'Energie Atomique Grenoble, France)
Date Acquired
August 12, 2013
Publication Date
May 1, 1985
Publication Information
Publication: NASA, Washington Microgravity Sci. and Appl. Program Tasks
Subject Category
Astronautics (General)
Accession Number
86N10079
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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