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A simple method of obtaining concentration depth-profiles from X-ray diffractionThe construction of composition profiles from X-ray intensity bands was investigated. The intensity band-to-composition profile transformation utilizes a solution which can be easily evaluated. The technique can be applied to thin films and thick speciments for which the variation of lattice parameters, linear absorption coefficient, and reflectivity with composition are known. A deconvolution scheme with corrections for the instrumental broadening and ak-alfadoublet is discussed.
Document ID
19860000843
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Wiedemann, K. E. (Analytical Services and Materials, Inc. Tabb, VA, United States)
Unnam, J. (Analytical Services and Materials, Inc. Tabb, VA, United States)
Date Acquired
September 5, 2013
Publication Date
January 1, 1984
Publication Information
Publisher: Metallurgical Society of AIME
Subject Category
Metallic Materials
Report/Patent Number
TMS-PAPER-F8415
NAS 1.26:176262
NASA-CR-176262
Accession Number
86N10310
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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