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Record Details

Record 8 of 2580
Metallic glass as a temperature sensor during ion plating
External Online Source: doi:10.1016/0040-6090(85)90217-2
Author and Affiliation:
Miyoshi, K.(NASA Lewis Research Center, Cleveland, OH, United States)
Spalvins, T.(NASA Lewis Research Center, Cleveland, OH, United States)
Buckley, D. H.(NASA Lewis Research Center, Cleveland, OH, United States)
Abstract: The temperature of the interface and/or a superficial layer of a substrate during ion plating was investigated using a metallic glass of the composition Fe67Co18B14Si1 as the substrate and as the temperature sensor. Transmission electron microscopy and diffraction studies determined the microstructure of the ion-plated gold film and the substrate. Results indicate that crystallization occurs not only in the film, but also in the substrate. The grain size of crystals formed during ion plating was 6 to 60 nm in the gold film and 8 to 100 nm in the substrate at a depth of 10 to 15 micrometers from the ion-plated interface. The temperature rise of the substrate during ion plating was approximately 500 C. Discontinuous changes in metallurgical microstructure, and physical, chemical, and mechanical properties during the amorphous to crystalline transition in metallic glasses make metallic glasses extremely useful materials for temperature sensor applications in coating processes.
Publication Date: Jan 01, 1985
Document ID:
19860032168
(Acquired Nov 28, 1995)
Accession Number: 86A16906
Subject Category: METALLIC MATERIALS
Document Type: Journal Article
Publication Information: Thin Solid Films (ISSN 0040-6090); 127; 115-122
Publisher Information: Switzerland
Financial Sponsor: NASA; United States
Organization Source: NASA Lewis Research Center; Cleveland, OH, United States
Description: 8p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright
NASA Terms: ION PLATING; METALLIC GLASSES; SUBSTRATES; SURFACE TEMPERATURE; TEMPERATURE SENSORS; CRYSTALLIZATION; ELECTRON MICROSCOPY; GOLD; MECHANICAL PROPERTIES; METAL FILMS; MICROSTRUCTURE; PHASE TRANSFORMATIONS; TRANSMISSION ELECTRON MICROSCOPY
Imprint And Other Notes: (International Conference on Metallurgical Coatings, San Diego, CA, Apr. 9-13, 1984) Thin Solid Films (ISSN 0040-6090), vol. 127, 1985, p. 115-122. Previously announced in STAR as N84-17351.
Miscellaneous Notes: Previously announced in STAR as N84-17351
Availability Source: Other Sources
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