Surface roughness studies for wind tunnel models used in high Reynolds number testing

This paper focuses on stylus and optical techniques for the measurement of surface roughness in wind tunnel models. The stylus instruments provide detailed information, such as surface profiles and area maps, that may then be used either to calculate statistical properties (i.e., the rms surface roughness) or to study individual surface peaks or other features. By contrast, certain optical techniques yield area-averaged statistical properties of the surface roughness directly. Two instruments that use the technique of optical angular scattering are compared. One is a research instrument that has been developed to study the basic scattering phenomena by testing the optical theories and surface models used in inverse calculations of statistical roughness parameters. The second instrument is more compact and is under development as a hand held, on-line device to be used during manufacture of wind tunnel models for the National Transonic Facility at NASA Langley Research Center. The scattering geometries for the two instruments are compared and results from these instruments and the stylus technique are shown for roughness specimens that are typical of the surface finish of wind tunnel models.