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Low flux laboratory test of the Internal Discharge Monitor (IDM) experiment intended for CRRESTwelve planar printed circuit board samples and four cable samples were exposed to a distributed electron source of 150 keV to 2.5 MeV at 4.5 pA/sq cm and were monitored for electron-caused EMP. Discharges were recorded on 10 of the 16 samples during the first 18 hours of testing (total incident fluence equaled 1.8 x 10 to the 12th e/sq cm).
Document ID
19860040784
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Coakley, P. G.
(JAYCOR San Diego, CA, United States)
Treadaway, M. J.
(JAYCOR San Diego, CA, United States)
Robinson, P. A., Jr.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 12, 2013
Publication Date
December 1, 1985
Publication Information
Publication: IEEE Transactions on Nuclear Science
Volume: NS-32
ISSN: 0018-9499
Subject Category
Ground Support Systems And Facilities (Space)
Accession Number
86A25522
Funding Number(s)
CONTRACT_GRANT: F29601-82-C-00023
Distribution Limits
Public
Copyright
Other

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