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Circuit analysis method for thin-film solar cell modulesThe design of a thin-film solar cell module is dependent on the probability of occurrence of pinhole shunt defects. Using known or assumed defect density data, dichotomous population statistics can be used to calculate the number of defects expected in a module. Probability theory is then used to assign the defective cells to individual strings in a selected series-parallel circuit design. Iterative numerical calculation is used to calcuate I-V curves using cell test values or assumed defective cell values as inputs. Good and shunted cell I-V curves are added to determine the module output power and I-V curve. Different levels of shunt resistance can be selected to model different defect levels.
Document ID
19860041251
Document Type
Reprint (Version printed in journal)
Authors
Burger, D. R.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 12, 2013
Publication Date
December 1, 1985
Publication Information
Publication: Solar Cells
Volume: 15
ISSN: 0379-6787
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Other
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