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Low energy X-ray spectra measured with a mercuric iodide energy dispersive spectrometer in a scanning electron microscopeA mercuric iodide energy dispersive X-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-K(alpha) at 5.9 keV and 195 eV (FWHM) for the Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies.
Document ID
19860042897
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Iwanczyk, J. S.
(University of Southern California Marina del Rey, CA, United States)
Dabrowski, A. J.
(University of Southern California Marina del Rey, CA, United States)
Huth, G. C.
(Southern California, University Marina del Rey, CA, United States)
Bradley, J. G.
(University of Southern California Marina del Rey, CA, United States)
Conley, J. M.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 12, 2013
Publication Date
February 1, 1986
Publication Information
Publication: IEEE Transactions on Nuclear Science
Volume: NS-33
ISSN: 0018-9499
Subject Category
Instrumentation And Photography
Accession Number
86A27635
Funding Number(s)
CONTRACT_GRANT: DE-AM03-76SF-00113
CONTRACT_GRANT: NSG-7535
CONTRACT_GRANT: NAS7-918
Distribution Limits
Public
Copyright
Other

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