Xe isotopic fractionation in a cathodeless glow discharge

Results are reported on the isotopic composition of Xe processed in cathodeless glow discharges in rarefied air at pressures of 20-40 microns Hg, in the presence of activated charcoal and in empty pyrex containers. Residual gas phase Xe and trapped Xe were found to be fractionated, with the trapped Xe fractionated up to 1 percent per amu. A model is presented for the fractionating process in which Xe ions are simultaneously implanted and sputtered from substrate material, with a mass dependence favoring retention of the heavy isotopes in the substrate. Results of the investigation show that plasma synthesis of carbonaceous material is unnecessary for producing Xe fractionations, and that the fractionations observed in previous synthesis experiments are probably due to implantation of ions into the synthesized material.