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Characterization and measurement of polymer wearAnalytical tools which characterize the polymer wear process are discussed. The devices discussed include: visual observation of polymer wear with SEM, the quantification with surface profilometry and ellipsometry, to study the chemistry with AES, XPS and SIMS, to establish interfacial polymer orientation and accordingly bonding with QUARTIR, polymer state with Raman spectroscopy and stresses that develop in polymer films using a X-ray double crystal camera technique.
Document ID
19860063667
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Buckley, D. H.
(NASA Lewis Research Center Cleveland, OH, United States)
Aron, P. R.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 12, 2013
Publication Date
January 1, 1985
Subject Category
Nonmetallic Materials
Accession Number
86A48405
Distribution Limits
Public
Copyright
Other

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