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Measuring Specific Heats at High TemperaturesFlash apparatus for measuring thermal diffusivities at temperatures from 300 to 1,000 degrees C modified; measures specific heats of samples to accuracy of 4 to 5 percent. Specific heat and thermal diffusivity of sample measured. Xenon flash emits pulse of radiation, absorbed by sputtered graphite coating on sample. Sample temperature measured with thermocouple, and temperature rise due to pulse measured by InSb detector.
Document ID
19870000391
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Vandersande, Jan W.
(Caltech)
Zoltan, Andrew
(Caltech)
Wood, Charles
(Caltech)
Date Acquired
August 13, 2013
Publication Date
September 1, 1987
Publication Information
Publication: NASA Tech Briefs
Volume: 11
Issue: 8
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-16765
Accession Number
87B10391
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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