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Measuring and Plotting Surface-Contour DeviationsHand-held device measures deviation of contour of surface from desired contour and provides output to x-y plotter. Carriage on device rolled along track representing desired contour, while spring-loaded stylus on device deflects perpendicularly to track to follow surface. Operator moves carriage of contour-measuring device on beamlike track. Stylus on carriage traces contour of surface above it. Carriage of measuring device holds transducer measuring cross-track displacement of surface from desired contour, and multiple-turn potentiometer measuring position along track.
Document ID
19870000483
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Aragon, Lino A.
(Rockwell International Corp.)
Shuck, Thomas
(Rockwell International Corp.)
Crockett, Leroy K.
(Rockwell International Corp.)
Date Acquired
August 13, 2013
Publication Date
October 1, 1987
Publication Information
Publication: NASA Tech Briefs
Volume: 11
Issue: 9
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MSC-21163
Accession Number
87B10483
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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