Analysis of normal and transparent silver Teflon

Samples of Inconel/silver/Teflon exposed to solar radiation, and atomic oxygen on Solar Max were microcharacterized. Those samples exposed to atomic oxygen from the metallic side had become transparent while those exposed from the Teflon side remained reflective. The difference between the transparent and non-transparent material was determined. Microcharacterization of these Inconel/silver/Teflon samples was performed using scanning electron microscopy with windowless energy dispersive X ray analysis, secondary ion mass spectrometry, and X ray photoelectron spectroscopy.