Diffraction efficiency of photothermoplastic layers for the recording of discrete holograms

An experimental and theoretical study of the dependence of eta of a digital phase Fourier hologram of a point object on the amount of deformation delta and the discrete-structure parameters representing the hologram is detailed. An expression is given for eta. Experiments were performed on photothermoplastic layers based on polyvinyl carbazole and trinitrofluorenone charge transfer complexes. The maximum eta, 2%, is found at delta = 0.56 micron.