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Complex dielectric constants for selected near-millimeter-wave materials at 245 GHzA double-beam instrument developed in this laboratory has been used to measure the complex dielectric constant of selected materials at 245 GHz. It is reported here the results for crystalline quartz, fused silica (Spectrosil WF and Dynasil 4000), beryllia (iso-pressed), boron nitride (hot-pressed), and a nickel ferrite (Trans-Tech 2-111). Results are compared with the data obtained by other researchers.
Document ID
19870024295
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Dutta, J. M.
(North Carolina Central Univ. Durham, NC, United States)
Jones, C. R.
(North Carolina Central University Durham, United States)
Dave, H.
(Applied Research Corp. Landover, MD, United States)
Date Acquired
August 13, 2013
Publication Date
September 1, 1986
Publication Information
Publication: IEEE Transactions on Microwave Theory and Techniques
Volume: MTT-34
ISSN: 0018-9480
Subject Category
Solid-State Physics
Report/Patent Number
AD-A176396
Accession Number
87A11569
Funding Number(s)
CONTRACT_GRANT: NAG1-187
CONTRACT_GRANT: DAAG29-83-G-0113
Distribution Limits
Public
Copyright
Other

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