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Record Details

Record 69 of 4108
Sensor-based fault diagnosis in a flight expert system
Author and Affiliation:
Ali, M.(Tennessee Univ., Tullahoma, TN, United States)
Scharnhorst, D. A.(Tennessee, University, Tullahoma, United States)
Abstract: A prototype of a knowledge-based flight expert system (FLES) has been developed to assist airplane pilots in monitoring, analyzing, and diagnosing faults and to provide support in reducing the pilot's own mistakes. A sensor simulation model has been developed to provide FLES with the airplane status information during the diagnostic process. The simulator is based partly on the Advanced Concept System (ACS), a future-generation airplane, and partly on the Boeing 737, an existing airplane. The architecture of FLES contains several subsystems. One of the major subsystems performs fault diagnosis in the electrical system of the ACS. This paper describes the mechanism and functionality of the automatic diagnosis performed in this expert system.
Publication Date: Jan 01, 1985
Document ID:
19870029407
(Acquired Nov 28, 1995)
Accession Number: 87A16681
Subject Category: AIRCRAFT INSTRUMENTATION
Document Type: Conference Paper
Publication Information: (SEE A87-16676)
Publisher Information: United States
Contract/Grant/Task Num: NAG1-513
Financial Sponsor: NASA; United States
Organization Source: Tennessee Univ.; Tullahoma, TN, United States
Description: 6p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright
NASA Terms: AIRBORNE/SPACEBORNE COMPUTERS; AUTOMATIC TEST EQUIPMENT; EXPERT SYSTEMS; FAULT TREES; FLIGHT SIMULATORS; IN-FLIGHT MONITORING; SENSORS; AIRCRAFT CONTROL; AIRCRAFT POWER SUPPLIES; ARCHITECTURE (COMPUTERS); BOEING 737 AIRCRAFT; KNOWLEDGE; PROTOTYPES
Imprint And Other Notes: IN: The engineering of knowledge-based systems; Proceedings of the Second Conference on Artificial Intelligence Applications, Miami Beach, FL, December 11-13, 1985 (A87-16676 05-63). Washington, DC, IEEE Computer Society Press, 1985, p. 49-54. FAA-supported research.
Availability Source: Other Sources
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